X-ray Photoelectron Spectroscopy


X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within the top 2-10nm of a material. The Escalab has a high intensity monochromated Al K? source which can be focussed to a spot 120-600 µm in diameter on the sample. XPS chemical maps of a sample with a 25 µm resolution can also be obtained. The instrument also has a high intensity UV source for Ultraviolet photoelectron Spectroscopy (UPS) and a FEGSEM for SEM imaging and Scanning Auger Microscopy. A focussed argon ion miller can be used to etch the sample in order to perform depth profiling XPS experiments.


Thermo Escalab 250


Molecular and Nanoscale Physics Group, School of Physics & Astronomy


Dr Benjamin Johnson
School of Physics & Astronomy
Email: b.r.g.johnson@leeds.ac.uk
Tel: 0113 343 7127