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X-ray Photoelectron Spectroscopy

Application

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within the top 2-10nm of a material. The Escalab has a high intensity monochromated Al K? source which can be focussed to a spot 120-600 µm in diameter on the sample. XPS chemical maps of a sample with a 25 µm resolution can also be obtained. The instrument also has a high intensity UV source for Ultraviolet photoelectron Spectroscopy (UPS) and a FEGSEM for SEM imaging and Scanning Auger Microscopy. A focussed argon ion miller can be used to etch the sample in order to perform depth profiling XPS experiments.

Equipment

Thermo Escalab 250

Location

Molecular and Nanoscale Physics Group, School of Physics & Astronomy

Contact

Dr Benjamin Johnson
School of Physics & Astronomy
Email: b.r.g.johnson@leeds.ac.uk
Tel: 0113 343 7127